S. E. Diehl - Concepedia

Author

S. E. Diehl

North Carolina State University

Also Known As

S. Diehl, S. E. Diehl, S.E. Diehl, Sherra E. Diehl

Publications

518

Citations

H-Index

Concepts

All Affiliations

North Carolina State University Sandia National Laboratories Auburn University The Aerospace Corporation

About

S. E. Diehl is an author at North Carolina State University specializing in engineering, computer engineering, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	13	13	509
2	Computer Engineering	12	12	491
3	Applied Physics	2	2	32
4	Education	1	1	131
5	Computer Science	1	1	49

S. E. Diehl

Publications

509

Citations

H-Index

Page 1

	Year	Citations
Suggested Single Event Upset Figure of Merit E.L. Petersen, J.B. Langworthy, S. E. Diehl IEEE Transactions on Nuclear Science EngineeringSpace EnvironmentDevice SusceptibilityEducationEvent Correlation	1983	131
Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMs S. E. Diehl, A. Ochoa, P. V. Dressendorfer, IEEE Transactions on Nuclear Science Static Rams ImmuneNon-volatile MemoryEngineeringVlsi DesignComputer Architecture	1982	83
Single Event Error Immune CMOS RAM Justin L. Andrews, John Schroeder, B. L. Gingerich, IEEE Transactions on Nuclear Science Hardware SecurityNon-volatile MemoryElectrical EngineeringEngineeringMemory Analysis	1982	71
Considerations for Single Event Immune VLSI Logic S. E. Diehl, J.E. Vinson, B.D. Shafer, IEEE Transactions on Nuclear Science Event-driven ArchitectureHardware TrojanEngineeringVlsi DesignVerification	1983	49
Dose-Rate Upset Patterns in a 16K CMOS SRAM L. W. Massengill, S. E. Diehl, J.S. Browning IEEE Transactions on Nuclear Science Hardware SecurityCmos SramVlsi DesignEngineeringBias Temperature Instability	1986	31
Comparison of Analytical Models and Experimental Results for Single Event Upset in CMOS SRAMs T. M. Mnich, S. E. Diehl, B.D. Shafer, IEEE Transactions on Nuclear Science Non-volatile MemorySingle Event UpsetHardening ThresholdEngineeringVlsi Design	1983	29
Soft Error Susceptibility of CMOS RAMS: Dependence upon Power Supply Voltage W. A. Kolasinski, R. Koga, J. B. Blake, IEEE Transactions on Nuclear Science EngineeringVlsi DesignHarris HmCmos 1024Computer Architecture	1981	18
Simulation of Worst-Case Total Dose Radiation Effects in CMOS VLSI Circuits B. L. Bhuva, J.J. Paulos, S. E. Diehl IEEE Transactions on Nuclear Science Electrical EngineeringReliability EngineeringCmos Vlsi CircuitsVlsi DesignCircuit Design	1986	18
An Efficient Numerical Algorithm for Simulation of MOS Capacitance R.C. Jaeger, F.H. Gaensslen, S. E. Diehl IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems Device ModelingNumerical AnalysisElectrical EngineeringSemiconductor DeviceEngineering	1983	18
Factors Contributing to Cmos Static Ram Upset Mark R. Ackermann, R. E. Mikawa, L. W. Massengill, IEEE Transactions on Nuclear Science Hardware SecurityElectrical EngineeringMemory ArchitectureEngineeringVlsi Design	1986	16

Page 1