S. E. Diehl

Suggested Single Event Upset Figure of Merit

E.L. Petersen, J.B. Langworthy, S. E. Diehl · IEEE Transactions on Nuclear Science · 1983 · 131 citations

Engineering, Space Environment, Device Susceptibility +20

Error Analysis and Prevention of Cosmic Ion-Induced Soft Errors in Static CMOS RAMs

S. E. Diehl, A. Ochoa, P. V. Dressendorfer et al. · IEEE Transactions on Nuclear Science · 1982 · 83 citations

Static Rams Immune, Non-volatile Memory, Engineering +16

Single Event Error Immune CMOS RAM

Justin L. Andrews, John Schroeder, B. L. Gingerich et al. · IEEE Transactions on Nuclear Science · 1982 · 71 citations

Hardware Security, Non-volatile Memory, Electrical Engineering +13

Considerations for Single Event Immune VLSI Logic

S. E. Diehl, J.E. Vinson, B.D. Shafer et al. · IEEE Transactions on Nuclear Science · 1983 · 49 citations

Event-driven Architecture, Hardware Trojan, Engineering +20

Dose-Rate Upset Patterns in a 16K CMOS SRAM

L. W. Massengill, S. E. Diehl, J.S. Browning · IEEE Transactions on Nuclear Science · 1986 · 31 citations

Hardware Security, Cmos Sram, Vlsi Design +10