J.B. Langworthy

Suggested Single Event Upset Figure of Merit

E.L. Petersen, J.B. Langworthy, S. E. Diehl · IEEE Transactions on Nuclear Science · 1983 · 131 citations

Engineering, Space Environment, Device Susceptibility +20

Two parameter Bendel model calculations for predicting proton induced upset (ICs)

W.J. Stapor, J.P. Meyers, J.B. Langworthy et al. · IEEE Transactions on Nuclear Science · 1990 · 77 citations

Engineering, Nuclear Physics, Nuclear Data +17

Heavy ion and proton analysis of a GaAs C-HIGFET SRAM

J.H. Cutchin, Paul W. Marshall, T.R. Weatherford et al. · IEEE Transactions on Nuclear Science · 1993 · 34 citations · Full text

Electrical Engineering, Engineering, Displacement Damage +13

Proton and heavy ion upsets in GaAs MESFET devices

T.R. Weatherfold, L. Tran, W.J. Stapor et al. · IEEE Transactions on Nuclear Science · 1991 · 30 citations

Device Modeling, Electrical Engineering, Heavy Ion Physic +15

The Fiber Optic Dosimeter on the Navigational Technology Satellite 2

Bruce D. Evans, George H. Sigel, J.B. Langworthy et al. · IEEE Transactions on Nuclear Science · 1978 · 29 citations

Engineering, Space Environment, Measurement +22