Two parameter Bendel model calculations for predicting proton induced upset (ICs)

Abstract

The two-parameter model of W.L. Bendel and E.L. Petersen (1984) represents an improvement over the existing single-parameter model in terms of the goodness of fit to actual proton upset data. It especially gives a better fit to the data from devices with small feature dimensions, which ultimately leads to a more accurate proton error rate prediction. Small feature sized devices have a proton upset energy dependence that cannot be accurately described with the one-parameter model and only one data point. There are no substantial differences in proton error rate predictions from one- and two-parameter approaches for older devices with larger feature sizes.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">&gt;</ETX>