Rosine Coq Germanicus

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

K. Niskanen, Antoine Touboul, Rosine Coq Germanicus et al. · IEEE Transactions on Nuclear Science · 2020 · 31 citations

Engineering, Electrical Engineering, Microelectronics +16

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

K. Niskanen, Rosine Coq Germanicus, A. Michez et al. · IEEE Transactions on Nuclear Science · 2021 · 31 citations · Full text

Engineering, Electrical Engineering, Nuclear Engineering +17

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Andrea Coronetti, Rubén García Alía, Jan Budroweit et al. · IEEE Transactions on Nuclear Science · 2021 · 30 citations · Full text

Engineering, Aerospace Engineering, Nuclear Engineering +16

Evaluation and prediction of the degradation of a COTS CCD induced by displacement damage

Rosine Coq Germanicus, S. Barde, L. Dusseau et al. · IEEE Transactions on Nuclear Science · 2002 · 27 citations

Engineering, Computer Engineering, Electrical Engineering +15

New Approach for the Prediction of CCD Dark Current Distribution in a Space Radiation Environment

Olivier Gilard, Mathieu Boutillier, Gianandrea Quadri et al. · IEEE Transactions on Nuclear Science · 2008 · 21 citations

Medicine, Electrical Engineering, Physics +10