K. Niskanen

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

C. Martinella, Philipp Natzke, Rubén García Alía et al. · Microelectronics Reliability · 2021 · 71 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Impact of Electrical Stress and Neutron Irradiation on Reliability of Silicon Carbide Power MOSFET

K. Niskanen, Antoine Touboul, Rosine Coq Germanicus et al. · IEEE Transactions on Nuclear Science · 2020 · 31 citations

Engineering, Electrical Engineering, Microelectronics +16

Neutron-Induced Failure Dependence on Reverse Gate Voltage for SiC Power MOSFETs in Atmospheric Environment

K. Niskanen, Rosine Coq Germanicus, A. Michez et al. · IEEE Transactions on Nuclear Science · 2021 · 31 citations · Full text

Engineering, Electrical Engineering, Nuclear Engineering +17

Radiation Hardness Assurance Through System-Level Testing: Risk Acceptance, Facility Requirements, Test Methodology, and Data Exploitation

Andrea Coronetti, Rubén García Alía, Jan Budroweit et al. · IEEE Transactions on Nuclear Science · 2021 · 30 citations · Full text

Engineering, Aerospace Engineering, Nuclear Engineering +16

Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET

K. Niskanen, H. Kettunen, Daniel Söderström et al. · IEEE Transactions on Nuclear Science · 2023 · 18 citations · Full text

Engineering, Electrical Engineering, Nuclear Materials +16