H. Kettunen

Comparison of Single Event Transients Generated at Four Pulsed-Laser Test Facilities-NRL, IMS, EADS, JPL

S. Büchner, Nicolas J.-H. Roche, Jeffrey H. Warner et al. · IEEE Transactions on Nuclear Science · 2012 · 51 citations

Engineering, Measurement, Laser-plasma Interaction +16

Influence of beam conditions and energy for SEE testing

V. Ferlet-Cavrois, J.R. Schwank, Siqing LIU et al. · 2011 · 26 citations

Electrical Engineering, Ion Implantation, Engineering +14

Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

Alexandre Bosser, Viyas Gupta, Arto Javanainen et al. · IEEE Transactions on Nuclear Science · 2018 · 17 citations · Full text

Hardware Security, Non-volatile Memory, Electrical Engineering +14

Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET

K. Niskanen, H. Kettunen, Daniel Söderström et al. · IEEE Transactions on Nuclear Science · 2023 · 17 citations · Full text

Investigation on MCU Clustering Methodologies for Cross-Section Estimation of RAMs

Alexandre Bosser, Viyas Gupta, Georgios Tsiligiannis et al. · IEEE Transactions on Nuclear Science · 2015 · 16 citations

Reliability Engineering, Engineering, Mcu Clustering Methodologies +13