Statistics
Publications
1
Citations
26
H-Index
1
Active since
2011
Affiliations
Siqing LIU is an author at Fraunhofer Institute for Technological Trend Analysis specializing in device characterization, radiation damage effects, and microelectronics.
Publications per year
2011–2011
1
1
Influence of beam conditions and energy for SEE testing
V. Ferlet-Cavrois, J.R. Schwank, Siqing LIU et al. · 2011 · 26 citations
Engineering, Electrical Engineering, Nuclear Engineering +17
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