Concepedia

Influence of beam conditions and energy for SEE testing

V. Ferlet-Cavrois, J.R. Schwank, Siqing LIU, M. Muschitiello, T. Beutier, Arto Javanainen, Alexander Hedlund, C. Poivey, Ali Zadeh, R. Harboe-Sørensen,

2011 · 26 citations · 15 references

Abstract

The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.

References

15

Geant4—a simulation toolkit

S. Agostinelli, John E. Allison, J. Apostolakis et al. · Nuclear Instruments and Methods in Physics Research Section A Accelerators Spectrometers Detectors and Associated Equipment · 2003 · 24.5K citations · Full text

Monte Carlo Simulation of Single Event Effects

Robert A. Weller, Marcus H. Mendenhall, Robert A. Reed et al. · IEEE Transactions on Nuclear Science · 2010 · 221 citations

Engineering, Electrical Engineering, Physics +16

The contribution of nuclear reactions to heavy ion single event upset cross-section measurements in a high-density SEU hardened SRAM

Kevin M. Warren, Robert A. Weller, Marcus H. Mendenhall et al. · IEEE Transactions on Nuclear Science · 2005 · 173 citations

Engineering, Electrical Engineering, Physics +17

Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

P.E. Dodd, J.R. Schwank, M.R. Shaneyfelt et al. · IEEE Transactions on Nuclear Science · 2007 · 123 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +16

From the Reference SEU Monitor to the Technology Demonstration Module On-Board PROBA-II

R. Harboe-Sørensen, C. Poivey, F.-X. Guerre et al. · IEEE Transactions on Nuclear Science · 2008 · 92 citations

Engineering, Nuclear Engineering, Instrumentation +11