Publication | Closed Access
Influence of beam conditions and energy for SEE testing
26
Citations
15
References
2011
Year
Unknown Venue
Electrical EngineeringIon ImplantationEngineeringMeasurementBeam ConditionsBias Temperature InstabilityOptical TestingComputer EngineeringEducationGeant4 SimulationsBeam EnergyIon BeamInstrumentationMicroelectronicsBeam Transport SystemDevice ResponseBeam Optic
The effects of heavy-ion test conditions and beam energy on device response are investigated. These effects are illustrated with two types of test vehicles; SRAMs and power MOSFETs. In addition, GEANT4 simulations have also been performed to better understand the results.
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