Concepedia

Publication | Open Access

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

DOIFull Paper Access

65

Citations

25

References

2021

Year

C. Martinella, Philipp Natzke, Rubén García Alía, Yacine Kadi, K. Niskanen, Mikko Rossi, Jukka Jaatinen, H. Kettunen, Alexander Tsibizov, Arto Javanainen
Microelectronics Reliability

References

YearCitations

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