Jukka Jaatinen

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti, Matteo Cecchetto, Jialei Wang et al. · 2020 · 221 citations · Full text

Engineering, Computer Engineering, Electrical Engineering +15

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

C. Martinella, Philipp Natzke, Rubén García Alía et al. · Microelectronics Reliability · 2021 · 71 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Effects of habitual physical activity on response to endurance training

Arto J. Hautala, Kaisu Martinmäki, Antti M. Kiviniemi et al. · Journal of Sports Sciences · 2012 · 58 citations

Education, Kinesiology, Physiology +17

Low Energy Protons at RADEF - Application to Advanced eSRAMs

H. Kettunen, Véronique Ferlet-Cavrois, Philippe Roché et al. · 2014 · 20 citations

Engineering, Electrical Engineering, Nuclear Engineering +16

Proton Irradiation-Induced Reliability Degradation of SiC Power MOSFET

K. Niskanen, H. Kettunen, Daniel Söderström et al. · IEEE Transactions on Nuclear Science · 2023 · 18 citations · Full text

Engineering, Electrical Engineering, Nuclear Materials +16