Mikko Rossi

SEU characterization of commercial and custom-designed SRAMs based on 90 nm technology and below

Andrea Coronetti, Matteo Cecchetto, Jialei Wang et al. · 2020 · 220 citations · Full text

Non-volatile Memory, Engineering, Vlsi Design +18

Time-of-flight – Energy spectrometer for elemental depth profiling – Jyväskylä design

Mikko Laitinen, Mikko Rossi, Jaakko Julin et al. · Nuclear Instruments and Methods in Physics Research Section B Beam Interactions with Materials and Atoms · 2014 · 78 citations

Elemental Depth, Analytical Instrumentation, Spectroscopy +7

Heavy-ion induced single event effects and latent damages in SiC power MOSFETs

C. Martinella, Philipp Natzke, Rubén García Alía et al. · Microelectronics Reliability · 2021 · 65 citations · Full text

Energy loss measurement of protons in liquid water

T. Siiskonen, H. Kettunen, K. Peräjärvi et al. · Physics in Medicine and Biology · 2011 · 36 citations

Nuclear Physics, Physics, Measurement +13

Low Energy Protons at RADEF - Application to Advanced eSRAMs

H. Kettunen, Véronique Ferlet-Cavrois, Philippe Roché et al. · 2014 · 20 citations

Engineering, Nuclear Physics, Mem Testing +18