V. Putcha

A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

Ben Kaczer, J. Franco, Pieter Weckx et al. · Microelectronics Reliability · 2018 · 65 citations

Circuit Time-dependent Variability, Electrical Engineering, Engineering +9

Stacked nanosheet fork architecture for SRAM design and device co-optimization toward 3nm

Pieter Weckx, Julien Ryckaert, V. Putcha et al. · 2017 · 48 citations

Engineering, Vlsi Design, Computer Architecture +17

Origins and implications of increased channel hot carrier variability in nFinFETs

B. Kaczer, J. Franco, M. Cho et al. · 2015 · 38 citations · Full text

Electrical Engineering, Engineering, Hardware Reliability +10

Statistical poly-Si grain boundary model with discrete charging defects and its 2D and 3D implementation for vertical 3D NAND channels

R. Degraeve, Sergiu Clima, V. Putcha et al. · 2015 · 38 citations

Engineering, Vertical Nand Devices, Defect Tolerance +18

Defect profiling in FEFET Si:HfO2 layers

Barry O’Sullivan, V. Putcha, Roman Izmailov et al. · Applied Physics Letters · 2020 · 33 citations · Full text

Ferroelectric Si-doped Hfo2, Electrical Engineering, Semiconductor Device +13