J. Franco

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Tibor Grasser, Ben Kaczer, Wolfgang Goes et al. · IEEE Transactions on Electron Devices · 2011 · 476 citations

Engineering, Electrical Engineering, Physics +15

Origin of NBTI variability in deeply scaled pFETs

B. Kaczer, Tibor Grasser, Ph. Roussel et al. · 2010 · 309 citations

Engineering, Electrical Engineering, Microelectronics +16

Comphy — A compact-physics framework for unified modeling of BTI

G. Rzepa, J. Franco, Barry O’Sullivan et al. · Microelectronics Reliability · 2018 · 210 citations

Natural Sciences, Physics, Nuclear Physics +5

Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise

Tibor Grasser, H. Reisinger, Wolfgang Goes et al. · 2009 · 116 citations

Engineering, Electrical Engineering, Physics +17

Recent advances in understanding the bias temperature instability

Tibor Grasser, B. Kaczer, Wolfgang Goes et al. · 2010 · 105 citations

Engineering, Physics, Fault Tolerance +7