H. Reisinger

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Tibor Grasser, Ben Kaczer, Wolfgang Goes et al. · IEEE Transactions on Electron Devices · 2011 · 476 citations

Engineering, Electrical Engineering, Physics +15

Origin of NBTI variability in deeply scaled pFETs

B. Kaczer, Tibor Grasser, Ph. Roussel et al. · 2010 · 309 citations

Engineering, Electrical Engineering, Microelectronics +16

The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability

Tibor Grasser, H. Reisinger, P.-J. Wagner et al. · 2010 · 285 citations · Full text

Engineering, Electrical Engineering, Physics +17

Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · 2006 · 273 citations

Engineering, Electrical Engineering, Circuit Theory +13

The statistical analysis of individual defects constituting NBTI and its implications for modeling DC- and AC-stress

H. Reisinger, Tibor Grasser, Wolfgang Gustin et al. · 2010 · 201 citations

Engineering, Electrical Engineering, Physics +17