P.-J. Wagner

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Tibor Grasser, Ben Kaczer, Wolfgang Goes et al. · IEEE Transactions on Electron Devices · 2011 · 462 citations

Engineering, Switching Oxide Traps, Reaction–diffusion Mechanism +18

The time dependent defect spectroscopy (TDDS) for the characterization of the bias temperature instability

Tibor Grasser, H. Reisinger, P.-J. Wagner et al. · 2010 · 282 citations · Full text

Engineering, Tdds Relies, Defect Tolerance +18

Analytic modeling of the bias temperature instability using capture/emission time maps

Tibor Grasser, P.-J. Wagner, H. Reisinger et al. · 2011 · 175 citations

Engineering, Earth Science, Reliability Engineering +18

Time-dependent defect spectroscopy for characterization of border traps in metal-oxide-semiconductor transistors

Tibor Grasser, H. Reisinger, P.-J. Wagner et al. · Physical Review B · 2010 · 149 citations

Electrical Engineering, Engineering, Physics +15

Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise

Tibor Grasser, H. Reisinger, Wolfgang Goes et al. · 2009 · 114 citations

Defect Tolerance, Electrical Engineering, Engineering +13