Wolfgang Heinrigs

Statistics

Publications

Citations

486

H-Index

Active since

2006

Affiliations

Infineon Technologies (Germany)(Current)

Wolfgang Heinrigs is an author at Infineon Technologies (Germany) specializing in engineering, reliability degradation mechanisms, and semiconductor reliability.

Publications per year

2006–2008

Publications

Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · 2006 · 273 citations

Engineering, Electrical Engineering, Circuit Theory +13

A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 76 citations

Engineering, Materials Science, Condition Assessment +13

A Comparison of Fast Methods for Measuring NBTI Degradation

H. Reisinger, Ulrich Brunner, Wolfgang Heinrigs et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 68 citations

Engineering, Electrical Engineering, Electronic Materials +13

On the impact of the NBTI recovery phenomenon on lifetime prediction of modern p-MOSFETs

Christian Schlünder, Wolfgang Heinrigs, Wolfgang Gustin et al. · 2006 · 29 citations

Engineering, Electrical Engineering, Electronic Materials +16

A novel multi-point NBTI characterization methodology using Smart Intermediate Stress (SIS)

Christian Schlünder, Marcel Hoffmann, R.‐P. Vollertsen et al. · 2008 · 25 citations

Engineering, Electrical Engineering, Materials Characterization +5

1–5 of 6