Wolfgang Heinrigs

Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · 2006 · 269 citations

Engineering, Vlsi Design, Fast Bulk +16

A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 75 citations

Engineering, Measurement, Life Prediction +22

A Comparison of Fast Methods for Measuring NBTI Degradation

H. Reisinger, Ulrich Brunner, Wolfgang Heinrigs et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 68 citations

Observed Differences, Fast Direct Threshold-voltage, Electrical Engineering +13

On the impact of the NBTI recovery phenomenon on lifetime prediction of modern p-MOSFETs

Christian Schlünder, Wolfgang Heinrigs, Wolfgang Gustin et al. · 2006 · 29 citations

Engineering, Modern P-mosfets, Lifetime Prediction +17

A novel multi-point NBTI characterization methodology using Smart Intermediate Stress (SIS)

Christian Schlünder, Marcel Hoffmann, R.‐P. Vollertsen et al. · 2008 · 25 citations

Numerical Analysis, Point Measurement, Engineering +26