Christian Schlünder

Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · 2006 · 269 citations

Engineering, Vlsi Design, Fast Bulk +16

The statistical analysis of individual defects constituting NBTI and its implications for modeling DC- and AC-stress

H. Reisinger, Tibor Grasser, Wolfgang Gustin et al. · 2010 · 199 citations

Engineering, Physical Origin, Defect Tolerance +21

Simultaneous Extraction of Recoverable and Permanent Components Contributing to Bias-Temperature Instability

Tibor Grasser, B. Kaczer, Ph. Hehenberger et al. · 2007 · 130 citations

Engineering, Measurement, Energy Efficiency +23

Understanding and modeling AC BTI

H. Reisinger, Tibor Grasser, K. Ermisch et al. · 2011 · 106 citations

Engineering, Oxide Border Traps, Power Electronics +19

A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 75 citations

Engineering, Measurement, Life Prediction +22