Oliver Blank

Analysis of NBTI Degradation- and Recovery-Behavior Based on Ultra Fast VT-Measurements

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · 2006 · 273 citations

Engineering, Electrical Engineering, Circuit Theory +13

A Comparison of Very Fast to Very Slow Components in Degradation and Recovery Due to NBTI and Bulk Hole Trapping to Existing Physical Models

H. Reisinger, Oliver Blank, Wolfgang Heinrigs et al. · IEEE Transactions on Device and Materials Reliability · 2007 · 76 citations

Engineering, Materials Science, Condition Assessment +13

A model for multistep trap-assisted tunneling in thin high-k dielectrics

Oliver Blank, H. Reisinger, R. Stengl et al. · Journal of Applied Physics · 2005 · 65 citations

Natural Sciences, Materials Engineering, Materials Science +17

Conformal aluminum oxide coating of high aspect ratio structures using metalorganic chemical vapor deposition

F. Wiest, V. Capodieci, Oliver Blank et al. · Thin Solid Films · 2005 · 14 citations

Natural Sciences, Materials Engineering, Materials Science +16

Evolution of reverse recovery in trench MOSFETs

Alessandro Ferrara, Ralf Siemieniec, U. Medic et al. · 2020 · 14 citations

Engineering, Electrical Engineering, Power Electronics +8