Publication | Closed Access
Evolution of reverse recovery in trench MOSFETs
12
Citations
3
References
2020
Year
Unknown Venue
Device ModelingElectrical EngineeringEngineeringElectronic EngineeringReverse Recovery ChargeBias Temperature InstabilityPower Semiconductor DeviceTrench Power MosfetsInverse ProblemsPower ElectronicsMicroelectronicsReverse Recovery
The interaction between the reverse recovery charge and the output charge in trench power MOSFETs is discussed. As the trade-off between the on-resistance and the gate charge improves, the output capacitance has more impact on the reverse recovery losses. The evolution of reverse recovery with trench technology is investigated by double-pulse measurements and TCAD simulations.
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