R.‐P. Vollertsen

On the weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination-part I: theory, methodology, experimental techniques

Ernest Y. Wu, R.‐P. Vollertsen · IEEE Transactions on Electron Devices · 2002 · 161 citations

Dielectrics, Polarity Dependence, Engineering +19

Experimental evidence of T/sub BD/ power-law for voltage dependence of oxide breakdown

Ernest Y. Wu, A. Vayshenker, E. Nowak et al. · IEEE Transactions on Electron Devices · 2002 · 145 citations

Electrical Engineering, Poisson Random Statistics, Engineering +12

Weibull breakdown characteristics and oxide thickness uniformity

L.-K. Han, R.‐P. Vollertsen, E. Nowak et al. · IEEE Transactions on Electron Devices · 2000 · 60 citations

Materials Engineering, Reliability, Electrical Engineering +15

Understanding soft and hard breakdown statistics, prevalence ratios and energy dissipation during breakdown runaway

J. Suñé, Ernest Y. Wu, David Jiménez et al. · 2002 · 54 citations

Engineering, Energy Dissipation, Bd Runaway +19

Dependence of dielectric time to breakdown distributions on test structure area

R.‐P. Vollertsen, Wilhelm Kleppmann · 2002 · 43 citations

Engineering, Dielectric Reliability Engineering, Mem Testing +19