Ernest Y. Wu

Recommended Methods to Study Resistive Switching Devices

Mario Lanza, H.‐S. Philip Wong, Eric Pop et al. · Advanced Electronic Materials · 2018 · 632 citations · Full text

Engineering, Power Electronics, Phase Change Memory +18

On the weibull shape factor of intrinsic breakdown of dielectric films and its accurate experimental determination-part I: theory, methodology, experimental techniques

Ernest Y. Wu, R.‐P. Vollertsen · IEEE Transactions on Electron Devices · 2002 · 161 citations

Dielectrics, Polarity Dependence, Engineering +19

Power-law voltage acceleration: A key element for ultra-thin gate oxide reliability

Ernest Y. Wu, J. Suñé · Microelectronics Reliability · 2005 · 151 citations

Electrical Engineering, Engineering, Nanoelectronics +9

Ultra-thin oxide reliability for ULSI applications

Ernest Y. Wu, J. H. Stathis, Liang-Kai Han · Semiconductor Science and Technology · 2000 · 146 citations

Engineering, Reliability Engineering, Nanoelectronics +16

Experimental evidence of T/sub BD/ power-law for voltage dependence of oxide breakdown

Ernest Y. Wu, A. Vayshenker, E. Nowak et al. · IEEE Transactions on Electron Devices · 2002 · 145 citations

Electrical Engineering, Poisson Random Statistics, Engineering +12