Comphy — A compact-physics framework for unified modeling of BTI

G. Rzepa, J. Franco, Barry O’Sullivan, A. Subirats, Marko Simicic, Geert Hellings, Pieter Weckx, Markus Jech, Theresia Knobloch, Michael Waltl,

Microelectronics Reliability · 2018 · 210 citations · 35 references

Concepts

References

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