Comphy — A compact-physics framework for unified modeling of BTI
G. Rzepa,
J. Franco,
Barry O’Sullivan,
A. Subirats,
Marko Simicic,
Geert Hellings,
Pieter Weckx,
Markus Jech,
Theresia Knobloch,
Michael Waltl,
Microelectronics Reliability · 2018 · 210 citations · 35 references