Markus Jech

Comphy — A compact-physics framework for unified modeling of BTI

G. Rzepa, J. Franco, Barry O’Sullivan et al. · Microelectronics Reliability · 2018 · 210 citations

Natural Sciences, Physics, Nuclear Physics +5

Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence

Wolfgang Goes, Yannick Wimmer, Al-Moatasem El-Sayed et al. · Microelectronics Reliability · 2018 · 133 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs

Stanislav Tyaginov, Markus Jech, J. Franco et al. · IEEE Electron Device Letters · 2015 · 78 citations

Engineering, Electrical Engineering, Materials Science +17

Impact of Mixed Negative Bias Temperature Instability and Hot Carrier Stress on MOSFET Characteristics—Part II: Theory

Markus Jech, Bianka Ullmann, G. Rzepa et al. · IEEE Transactions on Electron Devices · 2018 · 37 citations · Full text

Engineering, Electrical Engineering, Microelectronics +16

Ab initio investigations in amorphous silicon dioxide: Proposing a multi-state defect model for electron and hole capture

Christoph Wilhelmer, Dominic Waldhoer, Markus Jech et al. · Microelectronics Reliability · 2022 · 37 citations · Full text

Engineering, Materials Science, Physics +17