Al-Moatasem El-Sayed

Identification of oxide defects in semiconductor devices: A systematic approach linking DFT to rate equations and experimental evidence

Wolfgang Goes, Yannick Wimmer, Al-Moatasem El-Sayed et al. · Microelectronics Reliability · 2018 · 133 citations · Full text

Engineering, Electrical Engineering, Materials Science +17

Hydrogen-Induced Rupture of Strained Si─O Bonds in Amorphous Silicon Dioxide

Al-Moatasem El-Sayed, Matthew B. Watkins, Tibor Grasser et al. · Physical Review Letters · 2015 · 106 citations · Full text

Natural Sciences, Materials Science, Physics +17

On the microscopic structure of hole traps in pMOSFETs

Tibor Grasser, Wolfgang Goes, Yannick Wimmer et al. · 2014 · 98 citations

Engineering, Electrical Engineering, Physics +17

Theoretical models of hydrogen-induced defects in amorphous silicon dioxide

Al-Moatasem El-Sayed, Yannick Wimmer, Wolfgang Goes et al. · Physical Review B · 2015 · 96 citations

Natural Sciences, Materials Science, Physics +17

Intrinsic charge trapping in amorphous oxide films: status and challenges

Jack Strand, Moloud Kaviani, David Gao et al. · Journal of Physics Condensed Matter · 2018 · 87 citations · Full text

Natural Sciences, Materials Science, Physics +17