Statistics
Publications
45
Citations
2.1K
H-Index
25
Active since
2014
Affiliations
G. Rzepa is an author at TU Wien specializing in engineering, semiconductor devices, and microelectronics.
Publications per year
2014–2025
45
45
Comphy — A compact-physics framework for unified modeling of BTI
G. Rzepa, J. Franco, Barry O’Sullivan et al. · Microelectronics Reliability · 2018 · 210 citations
Long-Term Stability and Reliability of Black Phosphorus Field-Effect Transistors
Yu. Yu. Illarionov, Michael Waltl, G. Rzepa et al. · ACS Nano · 2016 · 200 citations
Wolfgang Goes, Yannick Wimmer, Al-Moatasem El-Sayed et al. · Microelectronics Reliability · 2018 · 133 citations · Full text
On the microscopic structure of hole traps in pMOSFETs
Tibor Grasser, Wolfgang Goes, Yannick Wimmer et al. · 2014 · 98 citations
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