Statistics
Publications
71
Citations
3.5K
H-Index
30
Active since
2012
Michael Waltl is an author at TU Wien specializing in engineering, semiconductor devices, and semiconductor defects.
Publications per year
2012–2024
71
71
Comphy — A compact-physics framework for unified modeling of BTI
G. Rzepa, J. Franco, Barry O’Sullivan et al. · Microelectronics Reliability · 2018 · 210 citations
Long-Term Stability and Reliability of Black Phosphorus Field-Effect Transistors
Yu. Yu. Illarionov, Michael Waltl, G. Rzepa et al. · ACS Nano · 2016 · 200 citations
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