Concepedia

Author

Stanislav Tyaginov

TU WienORCID

Also Known As

Michiel Vandemale, Philippe Roussel, S E Tyaginov, S. E. Tyaginov, S. Tyaginov, S. É. Tyaginov, S.E. Tyaginov, Stanislav E. Tyaginov, Stanislav Tyaginov, Tyaginov, S. E.

153

Publications

1.7K

Citations

24

H-Index

44

Concepts

All Affiliations

TU WienIMECIoffe InstituteAMS (Austria)Christian Doppler Laboratory for Thermoelectricity
ST

About

Stanislav Tyaginov is an author at TU Wien specializing in engineering, applied physics, and microelectronics.

Top Concepts

#ConceptH-IndexPublicationsCitations

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Engineering

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Applied Physics

21

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Electrical Engineering

20

33

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Natural Sciences

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Computer Engineering

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Stanislav Tyaginov

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41

Publications

1.3K

Citations

23

H-Index

YearCitations

Predictive Hot-Carrier Modeling of n-Channel MOSFETs

M. Bina, Stanislav Tyaginov, J. Franco,

IEEE Transactions on Electron Devices

2014

81

Understanding and Modeling the Temperature Behavior of Hot-Carrier Degradation in SiON nMOSFETs

Stanislav Tyaginov, Markus Jech, J. Franco,

IEEE Electron Device Letters

2015

76

Observation of Normally Distributed Energies for Interface Trap Recovery After Hot-Carrier Degradation

Gregor Pobegen, Stanislav Tyaginov, Michael Nelhiebel,

IEEE Electron Device Letters

2013

61

Determination of the hole effective mass in thin silicon dioxide film by means of an analysis of characteristics of a MOS tunnel emitter transistor

M. I. Vexler, Stanislav Tyaginov, A. F. Shulekin

Journal of Physics Condensed Matter

2005

57

Interface traps density-of-states as a vital component for hot-carrier degradation modeling

Stanislav Tyaginov, Ivan A. Starkov, O. Triebl,

Microelectronics Reliability

2010

57

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures

Alexander Grill, E. Bury, Jakob Michl,

2020

56

Modeling of hot-carrier degradation: Physics and controversial issues

Stanislav Tyaginov, Tibor Grasser

2012

55

Physical modeling of hot-carrier degradation for short- and long-channel MOSFETs

Stanislav Tyaginov, M. Bina, J. Franco,

2014

49

Physics-Based Hot-Carrier Degradation Modeling

Stanislav Tyaginov, Ivan A. Starkov, H. Enichlmair,

ECS Transactions

2011

48

Modeling of Hot-Carrier Degradation in nLDMOS Devices: Different Approaches to the Solution of the Boltzmann Transport Equation

Prateek Sharma, Stanislav Tyaginov, Yannick Wimmer,

IEEE Transactions on Electron Devices

2015

39

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