Jakob Michl

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures

Alexander Grill, E. Bury, Jakob Michl et al. · 2020 · 56 citations

Engineering, Semiconductor Device, Advanced Cmos +20

Toward Automated Defect Extraction From Bias Temperature Instability Measurements

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · IEEE Transactions on Electron Devices · 2021 · 37 citations

Engineering, Measurement, Education +23

Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · Microelectronics Reliability · 2023 · 29 citations · Full text

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Jakob Michl, Alexander Grill, Bernhard Stampfer et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 22 citations

Nuclear Tunneling, Quantum Science, Electrical Engineering +14

Efficient Modeling of Charge Trapping at Cryogenic Temperatures—Part I: Theory

Jakob Michl, Alexander Grill, Dominic Waldhoer et al. · IEEE Transactions on Electron Devices · 2021 · 17 citations