Concepedia

Jakob Michl

JM

Statistics

Publications

10

Citations

266

H-Index

10

Active since

2020

Affiliations

TU Wien(Current)

IMEC

Christian Doppler Laboratory for Thermoelectricity

Vrije Universiteit Brussel

Silvaco (United Kingdom)

Jakob Michl is an author at TU Wien specializing in semiconductor devices, microelectronics, and engineering.

Publications per year

2020–2023

10

Publications

10

Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures

Alexander Grill, E. Bury, Jakob Michl et al. · 2020 · 62 citations

Engineering, Electrical Engineering, Electronic Materials +16

Toward Automated Defect Extraction From Bias Temperature Instability Measurements

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · IEEE Transactions on Electron Devices · 2021 · 39 citations

Engineering, Electrical Engineering, Electronic Materials +16

Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · Microelectronics Reliability · 2023 · 34 citations · Full text

Engineering, Electrical Engineering, Physics +17

Evidence of Tunneling Driven Random Telegraph Noise in Cryo-CMOS

Jakob Michl, Alexander Grill, Bernhard Stampfer et al. · 2021 IEEE International Electron Devices Meeting (IEDM) · 2021 · 26 citations

Engineering, Electrical Engineering, Physics +17

Efficient Modeling of Charge Trapping at Cryogenic Temperatures—Part I: Theory

Jakob Michl, Alexander Grill, Dominic Waldhoer et al. · IEEE Transactions on Electron Devices · 2021 · 22 citations

Engineering, Electrical Engineering, Physics +16

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