Christian Schleich

The performance limits of hexagonal boron nitride as an insulator for scaled CMOS devices based on two-dimensional materials

Theresia Knobloch, Yu. Yu. Illarionov, Fabian Ducry et al. · Nature Electronics · 2021 · 350 citations · Full text

Engineering, Materials Engineering, Materials Science +17

Toward Automated Defect Extraction From Bias Temperature Instability Measurements

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · IEEE Transactions on Electron Devices · 2021 · 39 citations

Engineering, Electrical Engineering, Electronic Materials +16

Physical Modeling of Charge Trapping in 4H-SiC DMOSFET Technologies

Christian Schleich, Dominic Waldhoer, Katja Waschneck et al. · IEEE Transactions on Electron Devices · 2021 · 35 citations

Engineering, Electrical Engineering, Materials Science +17

Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · Microelectronics Reliability · 2023 · 34 citations · Full text

Engineering, Electrical Engineering, Physics +17

Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs

Christian Schleich, Judith Berens, G. Rzepa et al. · 2019 · 29 citations

Engineering, Electrical Engineering, Materials Science +17