Christian Schleich

The performance limits of hexagonal boron nitride as an insulator for scaled CMOS devices based on two-dimensional materials

Theresia Knobloch, Yu. Yu. Illarionov, Fabian Ducry et al. · Nature Electronics · 2021 · 330 citations · Full text

Electrical Engineering, Performance Limits, Scaled Cmos Devices +9

Toward Automated Defect Extraction From Bias Temperature Instability Measurements

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · IEEE Transactions on Electron Devices · 2021 · 37 citations

Engineering, Measurement, Education +23

Physical Modeling of Charge Trapping in 4H-SiC DMOSFET Technologies

Christian Schleich, Dominic Waldhoer, Katja Waschneck et al. · IEEE Transactions on Electron Devices · 2021 · 33 citations

Semiconductors, Defect Tolerance, Electrical Engineering +15

Comphy v3.0—A compact-physics framework for modeling charge trapping related reliability phenomena in MOS devices

Dominic Waldhoer, Christian Schleich, Jakob Michl et al. · Microelectronics Reliability · 2023 · 29 citations · Full text

Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs

Christian Schleich, Judith Berens, G. Rzepa et al. · 2019 · 28 citations

Higher Defect Density, Defect Tolerance, Electrical Engineering +11