Judith Berens

Towards Understanding the Physics of Gate Switching Instability in Silicon Carbide MOSFETs

Maximilian W. Feil, Katja Waschneck, H. Reisinger et al. · 2023 · 38 citations

Silicon Carbide Mosfets, Electrical Engineering, Engineering +12

Physical Modeling of Bias Temperature Instabilities in SiC MOSFETs

Christian Schleich, Judith Berens, G. Rzepa et al. · 2019 · 28 citations

Higher Defect Density, Defect Tolerance, Electrical Engineering +11

Detection and Cryogenic Characterization of Defects at the SiO₂/4H-SiC Interface in Trench MOSFET

Judith Berens, Fabian Rasinger, Thomas Aichinger et al. · IEEE Transactions on Electron Devices · 2019 · 22 citations

Semiconductors, Semiconductor Technology, Electrical Engineering +13

Microfluidic Irreversible Electroporation—A Versatile Tool to Extract Intracellular Contents of Bacteria and Yeast

Alexander Rockenbach, Suresh Sudarsan, Judith Berens et al. · Metabolites · 2019 · 21 citations · Full text

Gate Switching Instability in Silicon Carbide MOSFETs—Part I: Experimental

Maximilian W. Feil, Katja Waschneck, H. Reisinger et al. · IEEE Transactions on Electron Devices · 2024 · 20 citations