M. Bina

Predictive Hot-Carrier Modeling of n-Channel MOSFETs

M. Bina, Stanislav Tyaginov, J. Franco et al. · IEEE Transactions on Electron Devices · 2014 · 81 citations · Full text

Engineering, Power Electronics, Hcd Model +17

Experimental validation of a nonlinear <i>μ</i>FE model based on cohesive‐frictional plasticity for trabecular bone

Jakob Schwiedrzik, M. Bina, Michael L. Pretterklieber et al. · International Journal for Numerical Methods in Biomedical Engineering · 2015 · 54 citations

Physical modeling of hot-carrier degradation for short- and long-channel MOSFETs

Stanislav Tyaginov, M. Bina, J. Franco et al. · 2014 · 49 citations

Engineering, Power Electronics, Charge Transport +18

Degradation of time dependent variability due to interface state generation

M. Toledano-Luque, B. Kaczer, J. Franco et al. · Symposium on VLSI Technology · 2013 · 48 citations

Engineering, Time Dependent Variability, Interface Trap Generation +19

The relevance of deeply-scaled FET threshold voltage shifts for operation lifetimes

B. Kaczer, J. Franco, M. Toledano-Luque et al. · 2012 · 43 citations

Device Modeling, Electrical Engineering, Semiconductor Device +14