Michael Nelhiebel

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

Tibor Grasser, Ben Kaczer, Wolfgang Goes et al. · IEEE Transactions on Electron Devices · 2011 · 462 citations

Engineering, Switching Oxide Traps, Reaction–diffusion Mechanism +18

A two-stage model for negative bias temperature instability

Tibor Grasser, B. Kaczer, Wolfgang Goes et al. · IEEE International Reliability Physics Symposium proceedings · 2009 · 211 citations

Engineering, Two-stage Model, Stability +18

Analytic modeling of the bias temperature instability using capture/emission time maps

Tibor Grasser, P.-J. Wagner, H. Reisinger et al. · 2011 · 175 citations

Engineering, Earth Science, Reliability Engineering +18

Theory of orientation-sensitive near-edge fine-structure core-level spectroscopy

Michael Nelhiebel, P.-H. Louf, P. Schattschneider et al. · Physical review. B, Condensed matter · 1999 · 129 citations

X-ray Spectroscopy, Engineering, Physics +15

Switching oxide traps as the missing link between negative bias temperature instability and random telegraph noise

Tibor Grasser, H. Reisinger, Wolfgang Goes et al. · 2009 · 114 citations

Defect Tolerance, Electrical Engineering, Engineering +13