Concepedia
Statistics
Publications
20
Citations
605
H-Index
14
Active since
2005
Affiliations
IMEC(Current)
KU Leuven
TU Wien
University of Calabria
Seoul National University
M. Cho is an author at IMEC specializing in microelectronics, engineering, and electrical engineering.
Top concepts
EngineeringMicroelectronicsElectrical EngineeringApplied PhysicsElectronic PackagingNanoelectronicsComputer EngineeringPhysicsIntegrated CircuitsReliability Engineering
Publications per year
2005–2016
Trap Spectroscopy by Charge Injection and Sensing (TSCIS): A quantitative electrical technique for studying defects in dielectric stacks
R. Degraeve, M. Cho, B. Govoreanu et al. · 2008 · 96 citations
Engineering, Trap Density Profile, Charge Transport +21
Degradation and breakdown of 0.9 nm EOT SiO/sub 2/ ALD HfO/sub 2/metal gate stacks under positive constant voltage stress
R. Degraeve, T. Kauerauf, M. Cho et al. · 2006 · 63 citations
Engineering, Nuclear Physics, Charge Transport +19
Degradation of time dependent variability due to interface state generation
M. Toledano-Luque, B. Kaczer, J. Franco et al. · Symposium on VLSI Technology · 2013 · 48 citations
Engineering, Time Dependent Variability, Interface Trap Generation +19
BTI reliability of advanced gate stacks for Beyond-Silicon devices: Challenges and opportunities
G. Groeseneken, J. Franco, M. Cho et al. · 2014 · 41 citations
Reliability, Bti Reliability Framework, Electrical Engineering +15
Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?
T. Kauerauf, R. Degraeve, M. B. Zahid et al. · IEEE Electron Device Letters · 2005 · 40 citations
Engineering, Reliability Engineering, Nanoelectronics +17
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