M. B. Zahid

Trap Spectroscopy by Charge Injection and Sensing (TSCIS): A quantitative electrical technique for studying defects in dielectric stacks

R. Degraeve, M. Cho, B. Govoreanu et al. · 2008 · 96 citations

Engineering, Trap Density Profile, Charge Transport +21

Comprehensive investigation of on-state stress on D-mode AlGaN/GaN MIS-HEMTs

Tian‐Li Wu, Denis Marcon, M. B. Zahid et al. · 2013 · 54 citations

Wide-bandgap Semiconductor, Electrical Engineering, Reliability Engineering +9

Determination of capture cross sections for as-grown electron traps in HfO2∕HfSiO stacks

Chengzhi Zhao, J. F. Zhang, M. B. Zahid et al. · Journal of Applied Physics · 2006 · 46 citations

Engineering, Semiconductor Device, Capture Cross Sections +16

Validation of Retention Modeling as a Trap-Profiling Technique for SiN-Based Charge-Trapping Memories

A. Suhane, A. Arreghini, R. Degraeve et al. · IEEE Electron Device Letters · 2009 · 43 citations

Trap Distribution, Non-volatile Memory, Engineering +19

Abrupt breakdown in dielectric/metal gate stacks: a potential reliability limitation?

T. Kauerauf, R. Degraeve, M. B. Zahid et al. · IEEE Electron Device Letters · 2005 · 40 citations

Engineering, Reliability Engineering, Nanoelectronics +17