J. F. Zhang - Concepedia

Author

J. F. Zhang

Also Known As

J F Zhang, J. F. Zhang, J. Zhang, J. 俊 Zhang 张, J.F Zhang, J.F. Zhang, J.F. 建丰 Zhang 张, Jenny Zhang, Jian F. Zhang, Jian Fu Zhang

236

Publications

3.6K

Citations

H-Index

121

Concepts

All Affiliations

Liverpool John Moores University IMEC KU Leuven University of Liverpool University of Glasgow

About

J. F. Zhang is an author at Liverpool John Moores University specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	33	98	2.9K
2	Applied Physics	31	77	2.3K
3	Education	3	3	108
4	Natural Sciences	2	2	50
5	Social Sciences	2	2	65

J. F. Zhang

111

Publications

3.3K

Citations

H-Index

Page 1

	Year	Citations
Theoretical investigation of a 2 kA DC nitrogen arc in a supersonic nozzle J. F. Zhang, M.T.C. Fang, DE Newland Journal of Physics D Applied Physics AeroacousticsEngineeringFluid MechanicsMechanical EngineeringConvective Heat Transfer	1987	110
Ultra-high-speed directional protection of transmission lines using mathematical morphology Qinghua Wu, J. F. Zhang, D.J. Zhang IEEE Transactions on Power Delivery Electrical EngineeringMm TechniqueEngineeringFault DirectionMathematical Morphology	2003	97
Electron trap generation in thermally grown SiO2 under Fowler–Nordheim stress J. F. Zhang, Stephen Taylor, W. Eccleston Journal of Applied Physics SemiconductorsMaterials ScienceSemiconductor TechnologyEngineeringCrystalline Defects	1992	88
Positive bias temperature instability in MOSFETs J. F. Zhang, W. Eccleston IEEE Transactions on Electron Devices Electrical EngineeringEngineeringPhysicsNanoelectronicsBias Temperature Instability	1998	82
Hole Traps in Silicon Dioxides—Part I: Properties J. F. Zhang, Chengzhi Zhao, A.H. Chen, IEEE Transactions on Electron Devices Antineutralization Positive ChargesElectrical EngineeringEngineeringPhysicsNanoelectronics	2004	78
Effects of Dehydration and Rehydration on Cognitive Performance and Mood among Male College Students in Cangzhou, China: A Self-Controlled Trial Na Zhang, Song M. Du, J. F. Zhang International Journal of Environmental Research and Public Health	2019	77
Hole trapping and trap generation in the gate silicon dioxide J. F. Zhang, H.K. Sii, G. Groeseneken, IEEE Transactions on Electron Devices Electrical EngineeringEngineeringPhysicsFuture Generation CmosNanoelectronics	2001	68
Energy Distribution of Positive Charges in Gate Dielectric: Probing Technique and Impacts of Different Defects Sharifah Fatmadiana Wan Muhamad Hatta, Zhigang Ji, J. F. Zhang, IEEE Transactions on Electron Devices Wide-bandgap SemiconductorEngineeringGate DielectricEnergy DistributionSemiconductor Device	2013	59
Two-Pulse $C$–$V$ : A New Method for Characterizing Electron Traps in the Bulk of $ \hbox{SiO}_{2}/\hbox{high-}\kappa$ Dielectric Stacks Weidong Zhang, B. Govoreanu, Xiu Zheng, IEEE Electron Device Letters Non-volatile MemoryEngineeringEmerging Memory TechnologyCharacterizing Electron TrapsElectron Physic	2008	58
NBTI Lifetime Prediction and Kinetics at Operation Bias Based on Ultrafast Pulse Measurement Zhigang Ji, Long-Yi Lin, J. F. Zhang, IEEE Transactions on Electron Devices EngineeringMeasurementEducationReliability EngineeringPulse Power	2009	58

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