W. Eccleston

Physical origin of negative differential resistance in SOI transistors

Liam McDaid, Steven Hall, Phil Mellor et al. · Electronics Letters · 1989 · 118 citations

Ultra-low-threshold field emission from conjugated polymers

I. Musa, D. A. I. Munindrasdasa, G.A.J. Amaratunga et al. · Nature · 1998 · 105 citations

Materials Science, Engineering, Ultra-low-threshold Field Emission +4

Properties of regioregular poly(3-octylthiophene)/multi-wall carbon nanotube composites

I. Musa, Mark Baxendale, G.A.J. Amaratunga et al. · Synthetic Metals · 1999 · 90 citations

Materials Science, Composite Technology, Regioregular Poly +1

Electron trap generation in thermally grown SiO2 under Fowler–Nordheim stress

J. F. Zhang, Stephen Taylor, W. Eccleston · Journal of Applied Physics · 1992 · 88 citations

Semiconductors, Materials Science, Semiconductor Technology +14

Positive bias temperature instability in MOSFETs

J. F. Zhang, W. Eccleston · IEEE Transactions on Electron Devices · 1998 · 82 citations

Electrical Engineering, Engineering, Physics +9