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A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability

Circuit Time-dependent VariabilityElectrical EngineeringEngineeringNanoelectronicsStress-induced Leakage CurrentBias Temperature InstabilityTime-dependent Dielectric BreakdownCircuit ReliabilityMosfet InstabilitiesDevice ReliabilityMicroelectronicsDefect Properties