D. Becher

Process Technology Variation

Kelin J. Kuhn, M.D. Giles, D. Becher et al. · IEEE Transactions on Electron Devices · 2011 · 365 citations

Engineering, Computer Engineering, Electrical Engineering +17

Low-actuation voltage RF MEMS shunt switch with cold switching lifetime of seven billion cycles

R. Chan, Robert Lesnick, D. Becher et al. · Journal of Microelectromechanical Systems · 2003 · 129 citations

Engineering, Electrical Engineering, Materials Science +17

A comparison of state-of-the-art NMOS and SiGe HBT devices for analog/mixed-signal/RF circuit applications

Kelin J. Kuhn, R. Basco, D. Becher et al. · 2004 · 67 citations

Engineering, Electrical Engineering, Analog Electronics +16

Transistor aging and reliability in 14nm tri-gate technology

S. Novak, C. Parker, D. Becher et al. · 2015 · 65 citations

Engineering, Electrical Engineering, Electronic Materials +16

High sigma measurement of random threshold voltage variation in 14nm Logic FinFET technology

M.D. Giles, N. Arkali Radhakrishna, D. Becher et al. · 2015 · 49 citations

Engineering, Computer Engineering, Electrical Engineering +15