Concepedia

Publication | Closed Access

Effects of electrical stressing in power VDMOSFETs

DOI

37

Citations

23

References

2004

Year

N. Stojadinović, I. Manić, V. Davidović, Danijel Danković, S. Djoric-Veljković, S. Golubović, Sima Dimitrijev
Microelectronics Reliability

References

YearCitations

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