Short-channel Effects

Short-Channel Effects is a set of non-ideal electrostatic and carrier-transport phenomena in scaled MOSFETs that arises when the channel length becomes comparable to the source/drain depletion-region dimensions, causing loss of ideal gate control over the channel potential and consequent deviations from long-channel behavior such as threshold-voltage roll-off, drain-induced barrier lowering, velocity saturation, and increased leakage.

4.9K

Publications

220K

Citations

14.4K

Authors

1.6K

Institutions

Publications per year

2017–2026

793

Authors

14.4K

  1. CH
    Chenming Hu

    University of California, Berkeley, United States

    83 publications · 5.2K citations

    38

    h-index

  2. GG
    G. Ghibaudo

    Institut de Microélectronique, Electromagnétisme et Photonique, France

    69 publications · 2.5K citations

    29

    h-index

  3. GG
    G. Groeseneken

    IMEC, Belgium

    44 publications · 2.2K citations

    24

    h-index

  4. KR
    Kaushik Roy

    Purdue University West Lafayette, United States

    30 publications · 3.8K citations

    24

    h-index

  5. SC
    S. Cristoloveanu

    Institut polytechnique de Grenoble, France

    46 publications · 1.4K citations

    22

    h-index

1–5 of 14.4K

Venues

  1. IEEE Transactions on Electron Devices

    788 publications · 46.6K citations

    102

    h-index

  2. IEEE Electron Device Letters

    381 publications · 18.7K citations

    69

    h-index

  3. Solid-State Electronics

    465 publications · 15.3K citations

    56

    h-index

  4. IEEE Journal of Solid-State Circuits

    84 publications · 10.4K citations

    38

    h-index

  5. IEEE Transactions on Nuclear Science

    94 publications · 4.3K citations

    38

    h-index

1–5