R.H. Dennard - Concepedia

Author

R.H. Dennard

IBM Research - Thomas J. Watson Research Center

Also Known As

Dennard, R. DENNARD, R. Dennard, R. H. Dennard, R.H. Dennard, ROBERT H. DENNARD, Robert Dennard, Robert H. Dennard, Robert. H. Dennard

121

Publications

11.3K

Citations

H-Index

Concepts

All Affiliations

IBM Research - Thomas J. Watson Research Center IBM (United States)

About

R.H. Dennard is an author at IBM Research - Thomas J. Watson Research Center specializing in engineering, electrical engineering, and microelectronics.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	33	67	10.2K
2	Electrical Engineering	32	64	10.1K
3	Computer Engineering	27	42	5.7K
4	Applied Physics	19	32	6.6K
5	Computer Science	5	5	557

R.H. Dennard

Publications

11.1K

Citations

H-Index

Page 1

	Year	Citations
Design of ion-implanted MOSFET's with very small physical dimensions R.H. Dennard, F.H. Gaensslen, Hwa-Nien Yu, IEEE Journal of Solid-State Circuits EngineeringVlsi DesignIntegrated CircuitsPower ElectronicsConventional Mosfet	1974	3.4K
Device scaling limits of Si MOSFETs and their application dependencies D.J. Frank, R.H. Dennard, E. Nowak, Proceedings of the IEEE EngineeringTunneling CurrentsComputer ArchitectureSilicon On InsulatorHardware Security	2001	1.5K
Stable SRAM cell design for the 32 nm node and beyond L. Chang, David Fried, J. M. Hergenrother, Low-power ElectronicsNon-volatile MemoryElectrical EngineeringEngineeringVlsi Design	2005	564
Silicon CMOS devices beyond scaling Wilfried Haensch, E. Nowak, R.H. Dennard, IBM Journal of Research and Development EngineeringVlsi DesignIntegrated CircuitsInterconnect (Integrated Circuits)Advanced Packaging (Semiconductors)	2006	448
Generalized scaling theory and its application to a &#188; micrometer MOSFET design G. Baccarani, M.R. Wordeman, R.H. Dennard IEEE Transactions on Electron Devices	1984	438
An 8T-SRAM for Variability Tolerance and Low-Voltage Operation in High-Performance Caches Leland Chang, Robert K. Montoye, Yutaka Nakamura, IEEE Journal of Solid-State Circuits Electrical EngineeringHigh-performance CachesLow-voltage OperationVlsi DesignEngineering	2008	403
When are transmission-line effects important for on-chip interconnections? A. Deutsch, G.V. Kopcsay, P.J. Restle, IEEE Transactions on Microwave Theory and Techniques Short LinesElectrical EngineeringEngineeringVlsi DesignOn-chip Interconnections	1997	382
CMOS scaling for high performance and low power-the next ten years B. Davari, R.H. Dennard, G. Shahidi Proceedings of the IEEE Hardware SecurityLow-power ElectronicsElectrical EngineeringEngineeringVlsi Design	1995	376
Challenges and future directions for the scaling of dynamic random-access memory (DRAM) J. Mandelman, R.H. Dennard, G. Bronner, IBM Journal of Research and Development Non-volatile MemoryEngineeringDynamic Random-access MemoryEmerging Memory TechnologyComputer Architecture	2002	262
1 &#181;m MOSFET VLSI technology: Part IV&#8212;Hot-electron design constraints T.H. Ning, Peter W. Cook, R.H. Dennard, IEEE Transactions on Electron Devices	1979	247

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