David Fried

Stable SRAM cell design for the 32 nm node and beyond

L. Chang, David Fried, J. M. Hergenrother et al. · 2005 · 567 citations

Engineering, Computer Engineering, Electrical Engineering +17

Extension and source/drain design for high-performance finFET devices

J. Kedzierski, M. Ieong, E. Nowak et al. · IEEE Transactions on Electron Devices · 2003 · 244 citations

Engineering, Electrical Engineering, Electronic Materials +16

Metal-gate FinFET and fully-depleted SOI devices using total gate silicidation

J. Kedzierski, E. Nowak, T. Kanarsky et al. · 2003 · 172 citations

Engineering, Electrical Engineering, Materials Science +17

Hybrid-orientation technology (HOT): opportunities and challenges

Min Yang, V. Chan, K. Chan et al. · IEEE Transactions on Electron Devices · 2006 · 169 citations

Engineering, Electrical Engineering, Materials Science +17

Human–machine collaboration for improving semiconductor process development

Keren J. Kanarik, Wojciech T. Osowiecki, Yu Lu et al. · Nature · 2023 · 125 citations · Full text

Engineering, Electrical Engineering, Manufacturing Engineering +17