D.J. Frank

Device scaling limits of Si MOSFETs and their application dependencies

D.J. Frank, R.H. Dennard, E. Nowak et al. · Proceedings of the IEEE · 2001 · 1.6K citations

Engineering, Computer Engineering, Electrical Engineering +17

CMOS scaling into the nanometer regime

Yuan Taur, D. A. Buchanan, Wei Chen et al. · Proceedings of the IEEE · 1997 · 889 citations

Engineering, Computer Engineering, Electrical Engineering +17

Three-dimensional integrated circuits

Anna W. Topol, Douglas Charles La Tulipe, D.J. Frank et al. · IBM Journal of Research and Development · 2006 · 701 citations

Engineering, Computer Engineering, Electrical Engineering +17

High-performance CMOS variability in the 65-nm regime and beyond

K. Bernstein, D.J. Frank, Anne Gattiker et al. · IBM Journal of Research and Development · 2006 · 557 citations

Engineering, Computer Engineering, Electrical Engineering +17

Quasi-one-dimensional electron states in a split-gate GaAs/AlGaAs heterostructure

S.E. Laux, D.J. Frank, Frank Stern · Surface Science · 1988 · 405 citations

Engineering, Electrical Engineering, Physics +14