D. A. Buchanan

CMOS scaling into the nanometer regime

Yuan Taur, D. A. Buchanan, Wei Chen et al. · Proceedings of the IEEE · 1997 · 889 citations

Engineering, Computer Engineering, Electrical Engineering +17

Quantum-mechanical modeling of electron tunneling current from the inversion layer of ultra-thin-oxide nMOSFET's

S.-H. Lo, D. A. Buchanan, W. Wang · IEEE Electron Device Letters · 1997 · 812 citations

Engineering, Electrical Engineering, Microelectronics +16

Passivation and depassivation of silicon dangling bonds at the Si/SiO2 interface by atomic hydrogen

E. Cartier, J. H. Stathis, D. A. Buchanan · Applied Physics Letters · 1993 · 403 citations

Engineering, Materials Engineering, Materials Science +17

Ultrathin high-K metal oxides on silicon: processing, characterization and integration issues

E. P. Gusev, E. Cartier, D. A. Buchanan et al. · Microelectronic Engineering · 2001 · 386 citations

Natural Sciences, Materials Engineering, Materials Science +12

Scaling the gate dielectric: Materials, integration, and reliability

D. A. Buchanan · IBM Journal of Research and Development · 1999 · 363 citations

Engineering, Electrical Engineering, Materials Science +17