S.E. Laux

Statistics

Publications

Citations

5.7K

H-Index

Active since

1981

Affiliations

IBM Research - Thomas J. Watson Research Center(Current)

IBM (United States)

University of Tsukuba

University of Illinois Urbana-Champaign

University of Massachusetts Amherst

S.E. Laux is an author at IBM Research - Thomas J. Watson Research Center specializing in semiconductor devices, electrical engineering, and engineering.

Publications per year

1981–2012

Publications

Band structure, deformation potentials, and carrier mobility in strained Si, Ge, and SiGe alloys

Massimo V. Fischetti, S.E. Laux · Journal of Applied Physics · 1996 · 1.5K citations

Natural Sciences, Materials Science, Physics +17

Monte Carlo study of electron transport in silicon inversion layers

Massimo V. Fischetti, S.E. Laux · Physical review. B, Condensed matter · 1993 · 510 citations

Natural Sciences, Materials Science, Physics +17

Quasi-one-dimensional electron states in a split-gate GaAs/AlGaAs heterostructure

S.E. Laux, D.J. Frank, Frank Stern · Surface Science · 1988 · 405 citations

Engineering, Electrical Engineering, Physics +14

Techniques for small-signal analysis of semiconductor devices

S.E. Laux · IEEE Transactions on Electron Devices · 1985 · 229 citations

Engineering, Electrical Engineering, Circuit Theory +16

Understanding hot-electron transport in silicon devices: Is there a shortcut?

Massimo V. Fischetti, S.E. Laux, E.F. Crabbé · Journal of Applied Physics · 1995 · 223 citations

Engineering, Electrical Engineering, Materials Science +17

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