G. Ghibaudo

New method for the extraction of MOSFET parameters

G. Ghibaudo · Electronics Letters · 1988 · 831 citations

Engineering, Electrical Engineering, Microelectronics +15

Improved Analysis of Low Frequency Noise in Field-Effect MOS Transistors

G. Ghibaudo, O. Roux, Ch. Nguyen-Duc et al. · physica status solidi (a) · 1991 · 759 citations

Engineering, Electrical Engineering, Circuit Theory +16

Review on high-k dielectrics reliability issues

G. Ribes, Jérôme Mitard, M. Denais et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 523 citations

Engineering, Electrical Engineering, Materials Science +17

Ultimately thin double-gate SOI MOSFETs

T. Ernst, S. Cristoloveanu, G. Ghibaudo et al. · IEEE Transactions on Electron Devices · 2003 · 244 citations

Engineering, Electrical Engineering, Materials Science +17

HfO<sub>2</sub>-Based OxRAM Devices as Synapses for Convolutional Neural Networks

Daniele Garbin, Elisa Vianello, Olivier Bichler et al. · IEEE Transactions on Electron Devices · 2015 · 194 citations

Life Sciences, Electrical Engineering, Materials Science +16