Statistics
Publications
406
Citations
14.7K
H-Index
56
Active since
1983
G. Ghibaudo is an author at Institut de Microélectronique, Electromagnétisme et Photonique specializing in engineering, electrical engineering, and microelectronics.
Publications per year
1983–2024
406
406
Review on high-k dielectrics reliability issues
G. Ribes, Jérôme Mitard, M. Denais et al. · IEEE Transactions on Device and Materials Reliability · 2005 · 519 citations
Ultimately thin double-gate SOI MOSFETs
T. Ernst, S. Cristoloveanu, G. Ghibaudo et al. · IEEE Transactions on Electron Devices · 2003 · 244 citations
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1–5 of 406