S. Djoric-Veljković

NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors

V. Davidović, Danijel Danković, Aleksandar Ilić et al. · IEEE Transactions on Nuclear Science · 2016 · 227 citations

Consecutive Irradiation, Electrical Engineering, Negative Bias Temperature +12

Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

Danijel Danković, V. Davidović, S. Golubović et al. · Microelectronics Reliability · 2021 · 203 citations

Electrical Engineering, Engineering, Rf Semiconductor +8

Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors

Sandra Veljković, Nikola Mitrović, S. Djoric-Veljković et al. · 2021 · 195 citations

Device Modeling, Semiconductor Technology, Electrical Engineering +12

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs

N. Stojadinović, Danijel Danković, S. Djoric-Veljković et al. · Microelectronics Reliability · 2005 · 58 citations

Electrical Engineering, Engineering, Electronic Engineering +5

Importance of building orientation in determining daylighting quality in student dorm rooms: Physical and simulated daylighting parameters’ values compared to subjective survey results

Aleksandar Jovanović, Petar Pejić, S. Djoric-Veljković et al. · Energy and Buildings · 2014 · 47 citations

Built Environment, Building Performance, Occupant Comfort +3