Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs

Negative bias temperature instability: Road to cross in deep submicron silicon semiconductor manufacturing

D.K. Schroder, Jeff A. Babcock · Journal of Applied Physics · 2003 · 1K citations

Engineering, Electrical Engineering, Physics +17

The Paradigm Shift in Understanding the Bias Temperature Instability: From Reaction–Diffusion to Switching Oxide Traps

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Engineering, Electrical Engineering, Physics +15

NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors

V. Davidović, Danijel Danković, Aleksandar Ilić et al. · IEEE Transactions on Nuclear Science · 2016 · 227 citations

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Effects of hydrogen transport and reactions on microelectronics radiation response and reliability

Daniel M. Fleetwood · Microelectronics Reliability · 2002 · 147 citations

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Comparison of 60Co Response and 10 KeV X-Ray Response in MOS Capacitors

Timothy R. Oldham, J.M. McGarrity · IEEE Transactions on Nuclear Science · 1983 · 116 citations

Engineering, Electrical Engineering, Materials Science +17