Publication | Closed Access
Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs
203
Citations
27
References
2021
Year
Electrical EngineeringEngineeringRf SemiconductorElectronic EngineeringBias Temperature InstabilityApplied PhysicsPower Semiconductor DeviceP-channel Power VdmosfetsMicroelectronicsRelated EffectsSemiconductor Device
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