Danijel Danković - Concepedia

Author

Danijel Danković

Also Known As

Aneta Prijić, D DANKOVIC, D Danković, D. Dankovic, D. Danković, Danijel Dankovic, Danijel Danković, Danijel M. Danković, Emilija Živanović, Vesna Paunović

119

Publications

1.4K

Citations

H-Index

Concepts

All Affiliations

University of Nis Serbian Academy of Sciences and Arts Griffith University Bulgarian Academy of Sciences Georgi Nadjakov Institute of Solid State Physics

About

Danijel Danković is an author at University of Nis specializing in engineering, microelectronics, and electrical engineering.

Top Concepts

#	Concept	H-Index	Publications	Citations
1	Engineering	16	27	1.1K
2	Applied Physics	13	17	846
3	Social Sciences	1	1	15
4	Biomedical Engineering	1	1	15
5	Chemistry	1	1	15

Danijel Danković

Publications

1.2K

Citations

H-Index

Page 1

	Year	Citations
NBTI and Irradiation Effects in P-Channel Power VDMOS Transistors V. Davidović, Danijel Danković, Aleksandar Ilić, IEEE Transactions on Nuclear Science Consecutive IrradiationElectrical EngineeringNegative Bias TemperatureEngineeringPhysics	2016	227
Radiation and annealing related effects in NBT stressed P-channel power VDMOSFETs Danijel Danković, V. Davidović, S. Golubović, Microelectronics Reliability Electrical EngineeringEngineeringRf SemiconductorElectronic EngineeringBias Temperature Instability	2021	203
Effects of Bias Temperature Stress and Irradiation in Commercial p-Channel Power VDMOS Transistors Sandra Veljković, Nikola Mitrović, S. Djoric-Veljković, Device ModelingSemiconductor TechnologyElectrical EngineeringEngineeringStress-induced Leakage Current	2021	195
Negative bias temperature instability mechanisms in p-channel power VDMOSFETs N. Stojadinović, Danijel Danković, S. Djoric-Veljković, Microelectronics Reliability Electrical EngineeringEngineeringElectronic EngineeringBias Temperature InstabilityP-channel Power Vdmosfets	2005	58
Effects of electrical stressing in power VDMOSFETs N. Stojadinović, I. Manić, V. Davidović, Microelectronics Reliability Electrical EngineeringEngineeringStress-induced Leakage CurrentBias Temperature InstabilityPower Vdmosfets	2004	37
NBT stress-induced degradation and lifetime estimation in p-channel power VDMOSFETs Danijel Danković, I. Manić, S. Djoric-Veljković, Microelectronics Reliability Electrical EngineeringEngineeringNbt Stress-induced DegradationStress-induced Leakage CurrentBias Temperature Instability	2006	35
Negative bias temperature instability in n-channel power VDMOSFETs Danijel Danković, I. Manić, V. Davidović, Microelectronics Reliability Electrical EngineeringN-channel Power VdmosfetsEngineeringElectronic EngineeringBias Temperature Instability	2008	31
Modeling of NBTS Effects in P-Channel Power VDMOSFETs Danijel Danković, Nikola Mitrović, Zoran Prijić, IEEE Transactions on Device and Materials Reliability Device ModelingElectrical EngineeringEngineeringPulsed Stress VoltageHigh Voltage Engineering	2020	30
A smart weather station based on sensor technology Miloš Djordjević, Danijel Danković Facta universitatis - series Electronics and Energetics Sensor NetworksSmart SensorEnvironmental MonitoringThings TechnologySensors	2019	22
A smart data logger system based on sensor and Internet of Things technology as part of the smart faculty Miloš Djordjević, Branislav Jovičić, Stefan Marković, Journal of Ambient Intelligence and Smart Environments Iot Data AnalyticsSmart SensorWeb Of ThingEngineeringThings Technology	2020	20

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