Concepedia

Publication | Closed Access

Negative bias temperature instability mechanisms in p-channel power VDMOSFETs

DOI

58

Citations

14

References

2005

Year

N. Stojadinović, Danijel Danković, S. Djoric-Veljković, V. Davidović, I. Manić, S. Golubović
Microelectronics Reliability

References

YearCitations

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